SN74HC164N PDF

The gated serial A and B inputs permit complete control over incoming data; a low at either input inhibits entry of the new data and resets the first flip-flop to the low level at the next clock CLK pulse. A high-level input enables the other input, which then determines the state of the first flip-flop. Data at the serial inputs can be changed while CLK is high or low, provided the minimum setup time requirements are met. Clocking occurs on the low-to-high-level transition of CLK. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. On all other products, production processing does not necessarily include testing of all parameters.

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The gated serial A and B inputs permit complete control over incoming data; a low at either input inhibits entry of the new data and resets the first flip-flop to the low level at the next clock CLK pulse. A high-level input enables the other input, which then determines the state of the first flip-flop.

Data at the serial inputs can be changed while CLK is high or low, provided the minimum setup time requirements are met. Clocking occurs on the low-to-high-level transition of CLK. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

On all other products, production processing does not necessarily include testing of all parameters. Products conform to specifications per the terms of Texas Instruments standard warranty.

Production processing does not necessarily include testing of all parameters. Supply voltage range, VCC. Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied.

Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. NOTES: 1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.

The package thermal impedance is calculated in accordance with JESD Search Circuit. Section Supplier Datasheet. Toggle navigation Digchip. The design engineer inevitably encounter Doc.

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Datasheet Texas Instruments SN74HC164N

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Texas Instruments SN74HC164N

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